Arya Bhatta Journal of Mathematics and Informatics

  • Year: 2017
  • Volume: 9
  • Issue: 1

Software reliability growth model involving time dependent test effort function with imperfect debugging

  • Author:
  • Suneet Saxena
  • Total Page Count: 6
  • DOI:
  • Page Number: 41 to 46

Assistant Professor, Department of Mathematics, SRMS College of Engineering & Technology, Bhojipura, Bareilly (U.P), India, Email: Sunarn2012@gmail.com

Abstract

The paper presents NHPP Software Reliability Growth model involving test effort function(TEF) under imperfect debugging. TEF deals with the problem of limited time and resources available during software testing phase. Imperfect debugging represents introduction of new faults during fault removal process. SRGM model has been developed to address the problem of limited time, resources and occurrence of new faults. Existing TEF models compared with modified TEF models using statistical tools SSE, R2 and AIC. Results suggest that the modified TEF models fits and predict faults detection data better.

Keywords

Akaike's Information Criterion, Imperfect debugging, NHPP Models, Test Effort Function