Temperature-dependent surface topography analysis of SnSe thin films using atomic force microscopy

Tin selenide thin films have been prepared by a simple and highly reproducible chemical bath deposition method. The effect of various bath temperatures was study. The surface topography of the films has been analysed by means of the atomic force microscopy. We have observed a very strong dependence of the surface roughness, film thickness and grain size on the growth temperature. Smaller grain size, thinner and smoother films could be observed for the films deposited at lower bath temperature.