Twenty nine disease resistant and twenty five susceptible mutant lines of tetraploid wheat from the parent DDK 1001 and cross DDK 1001 X DWR 1006 from M2 generation showed similar reaction against spot blotch, both in M3 and M4 generation in field. These mutant lines along with resistant (DWR 1006) and susceptible (DDK 1001) untreated parent were used for molecular confirmation. Molecular characterization of mutant lines and untreated parents by Random Amplified Polymorphic DNA (RAPD) revealed that OPM-18 produced an unique amplified fragment (1100bp) in spot blotch susceptible mutant lines and also in susceptible parent DDK-1001, as compared to resistant lines.
Emmer wheat, RAPD, spot blotch
