Bhartiya Krishi Anusandhan Patrika
  • Year: 2011
  • Volume: 26
  • Issue: 3and4

Combining ability analysis under different locations of U.P. in wheat (Triticum aestivum L.)

  • Author:
  • S.V. Singh1, R.K. Yadav
  • Total Page Count: 5
  • Page Number: 118 to 122

1Asstt. Prof. (Plant Breeding), R.A.R.S., Bharari, Jhansi  (U.P.) -284003

Department of genetics and Plant Breeding, C.S.A. University of Agriculture & Technology, Kanpur-208002 (U.P.)

Online published on 24 July, 2012.

Abstract

Combining ability analysis for grain yield and its contributing traits was done through diallel cross analysis involving 10 diverse genotypes over three locations to identify certain parents/crosses which can be used in wheat improvement programme. Analysis of variance for combining ability pooled over locations showed highly significant GCA and SCA variances for all the characters in both F1 and F2 generations, indicating importance of both additive and non-additive gene actions. GCA x environment and SCA x environment interactions also exhibited highly significant differences for all the attributes in both the generations. The parents K. 68, K. 9107 and K. 8027 were observed as good general combiners for grain yield/plant in both F1 and F2 progenies. The cross combinations namely, H.P. 1633 x K. 9644, C. 306 x K. 123, K. 9107 x K. 9644, C. 306 x H.P. 1633, C. 306 x K. 9644, K. 68 x K. 123, K. 68 x K. 8027 and K. 68 x K. 9644, were identified as good specific combiners for grain yield/plant in both F1 and F2 generations.