Bulletin of Pure & Applied Sciences- Physics

  • Year: 2015
  • Volume: 34d
  • Issue: 2

Variation of Profile Parameters in Dyed Silk Fibers

  • Author:
  • K. Hemalatha1, H. Somashekarappa1,, R. Gopalkrishne Urs2, V. Annadurai3, R Somashekar4
  • Total Page Count: 9
  • Page Number: 85 to 93

1Department of Physics, Yuvaraja's College, University of Mysore, Mysuru-570005

2Department of Physics, National Institute of Engineering, Mysuru-570008

3Department of Physics, Sambhram Institute of Technology, Bengaluru-560097

4Department of Studies in Physics, University of Mysore, Manasagangotri, Mysuru-570006

Abstract

Several varieties of silk fibers, all belonging to Bombyx Mori family, were investigated for the microstructural changes when dyed using X-ray diffraction method. The variation of these parameters indicates that there is degradation of fibers due to dying. These changes in fibers occur due to fragility of hydrogen bonds, which are perpendicular to the fiber axis, in the β-pleated sheets.

Keywords

Silk Fibers, Degradation, Paracrystallinity, Tensile strength, X-ray diffraction