1Department of Genetics and Plant Breeding, C.S. Azad University of Agriculture and Technology, Kanpur-208 002 (Uttar Pradesh), India
2Department of Genetics and Plant Breeding, Institute of Agricultural Sciences, Banaras Hindu University, Varanasi-221 005 (Uttar Pradesh), India, Email: lbgpbbhu@gmail.com
Department of Genetics and Plant Breeding, B.R.D. Post Graduate College, Deoria-274 001 (Uttar Pradesh), India
*Email of corresponding author: scgaur101@gmail.com
The experiment was carried out during rabi season 2007–08 at Deoria(Uttar Pradesh), India. Forty five F1s, 45F2S and grain yield and its components in a diallel set derived from 10 promising lines were tested in a randomized block design with three replications in wheat [Triticum aestivum (L.) emend. Fiori & Paol.]. The study revealed that 26 crosses of positive and significant values and 16 combinations of negative and significant values for inbreeding depression (26.39 to 29.80%) were independently associated with heterosis. The heterosis over economic parent for grain yield plant−1 (−37.53 to 31.26%) exhibited negative performance in all the combinations, except PBW 343 x K 9107, K 9107 x K88, K9107 x K8962, K88 x K8962, K8962 x K9533, K8962 x KRL1-4 and HUW 234 x K816, whereas non-significant heterosis were observed in PBW 343 x K9533, PBW 343 x KRL1-4, K88 x HP1633 and K9533 x K7903 crosses in first filial generation. In breeding depression of this trait (range from -15.19 to 65.67%) exhibited mostly positive and significant performance in all the combinations indicate the prevalence of non-additive gene effects due to genetic variability in the population.
Diallel, Heyerosis, Inbreeding depression, Triticum aestivum, Yield