1Directorate of Maize Research, IARI, PUSA Campus, New Delhi, India
Department of Genetics and Plant Breeding, College of Agriculture, ANGRAU, Rajendranagar, Hyderabad - 500 030, India
*Part of M.Sc Thesis submitted by the first author to Acharya N.G. Ranga Agriculture University, Hyderabad-500 030.
A line x tester set was obtained by crossing 10 inbred lines with four testers in maize. Forty F1‘s along with 14 parents and two standard checks were evaluated for twelve characters during rabi 2005-06. Out of 40 crosses, 29 crosses over better parent and 7 crosses over standard check were significantly out yielded for grain yield. The cross CM-121 x DMR-201 showed high heterosis over better parent and standard check (DHM-103) for grain yield per plant as well as for 100 seed weight, plant height, ear height, ear length, number of seeds per row, number seeds per ear. Thus, this cross posses high heterosis and in future this could be exploited commercially for higher yield.
Line x tester, Heterosis, Yield, Maize
