1Associate Professor in Computer Science and Engineering, D.K.T.E. Society's Textile and Engineering Institute, Ichalkaranji, India
2Professor in Electronics Engineering, Department of Electronics Engineering, Rajarshi Shahu College of Engineering, Pune, India
The paper presents a concurrent fault diagnostic expert system framework. The framework is characterised by two basic features. The first includes a concurrent fault diagnostic strategy, which utilises fault isolation and diagnostic knowledge about unit under test. The second characteristic is object-oriented inference mechanism using simultaneous message passing using multithreading. Object orientation in inference mechanism has improved inference efficiency. The degree of accuracy to which faults are located is improved using fault isolation knowledge. The developed framework is evaluated for its effectiveness and superiority compared with earlier approaches using case studies.
Knowledge, Inference, Object, Microcontroller, Heuristics, Inheritance, Concurrent, Efficiency
