Indian Journal of Cryogenics
  • Year: 2020
  • Volume: 45
  • Issue: 1

I-V characterization of HTS tape under tensile stress using cryogenic UTM along with FEM analysis

  • Author:
  • Ankit Anand1,*, Srikumar Nayek1, Abhay Singh Gour1, V.V. Rao1
  • Total Page Count: 4
  • Published Online: Mar 9, 2021
  • Page Number: 130 to 133

1Cryogenic Engineering Centre, Indian Institute of Technology, Kharagpur

*E-mail ID: ankit5088@gmail.com

Abstract

An indigenous Cryogenic Universal Testing Machine (C-UTM) capable of creating tensile strain in 2G HTS tape under superconducting state is developed. Stress-strain property of superpower make SCS4100 HTS 2G tape is measured using this and were used for FEM analysis. A suitable instrumentation was done to measure I-Vcharacteristic (4-Probe method) of HTS 2G tape under tensile strain using developed cryogenic UTM. I-V characteristics of 2G HTS tapes is used for developing HTS 2G tape based devices such as cables, motors, generators, Superconducting Fault Current Limiters(SFCL) and Superconducting Magnet Energy Storage(SMES).

Keywords

HTS 2G tape.Strees-Strain test, FEM, C-UTM, Superconductor