1II year M. Tech Student, Dr. K.V. Subba Reddy Institute of Technology, Kurnool, India
2Assistant Professor, E.C.E. Department, Dr. K.V. Subba Reddy Institute of Technology, Kurnool, India
Online published on 8 November, 2017.
This paper proposes an enhanced IEEE 1500 test wrapper to support the testing and diagnosis of the single-port or multi-port RAM core attached to the enhanced IEEE 1500 test wrapper without incurring large area overhead to small memories. Effective test time reduction techniques for the proposed test scheme are also proposed.
IEEE 1500 test, multi-port RAM, IC, SOC
