International Journal of Engineering and Management Research (IJEMR)
  • Year: 2016
  • Volume: 6
  • Issue: 3

Different Analytical Techniques to Investigate Ion Implantetion Effects in Semiconductor Thin Film

  • Author:
  • C.D. Patel1, M.V. Patel2
  • Total Page Count: 3
  • Page Number: 585 to 587

1Assistant Professor and Head, Physics Department, Smt. S.S. Patel Nootan Science and Commerce College, Visnagar, India

2Assistant Professor, Physics, Sankalchand Patel College of Engineering, Visnagar, India

Online published on 24 October, 2017.

Abstract

The present paper has explained the details of the experimental stages like the details of ion implantation and the different analytical techniques like, X-ray diffraction, Raman scattering spectroscopy, optical absorption spectrometry and electron microscopy.

Keywords

Nitrogen, Pressure, Magnet