1University Dept. of Physics, Vinoba Bhave University, Hazaribag-825301 (Jharkhand), India
2University Dept. Of Physics, Veer Kunwar Singh University, Ara, Bihar-802312, India
3University Dept. of Physics, Vinoba Bhave University, Hazaribag-825301 (Jharkhand), India
Online published on 19 April, 2019.
In this paper a linear relation H= (0.199–0.037λ1.9401) B-(7.754–1.706λ.746) where B is the bulk modulus and λ is a parameter which is the average difference of group numbers of the constituent atoms (in the periodic table) of the compounds is proposed for microhardness of ANB8-N (N = 2, 3, 4) semiconductors. This equation has been obtained through the linear relations proposed for microhardness and bulk modulus in terms of bond hardness. Estimated values of B for group-IV, IV-IV, II-VI and III-V semiconductors are in closer agreement with the experimental and reported values. Microhardness of Sn, SiC, GeC, SnC, SiGe, SiSn, GeSn, BSb and CdO has been reported for the first time.
Semiconductors, structural properties, microhardness, bulk modulus