The Indian Journal of Genetics and Plant Breeding
SCOPUSWeb of Science
  • Year: 1995
  • Volume: 55
  • Issue: 2

Genetical analysis of some quantitative components of yield in breadwheat

  • Author:
  • J. S. Amawate, P. N. Behl
  • Total Page Count: 4
  • Page Number: 120 to 123

Division of Genetics, Indian Agricultural Research Institute, New Delhi 110012.

Abstract

Absence of epistasis was noticed in some cross combinations between semidwarf/dwarf and tall wheats for grain yield per plant, ear length and grains/ear. Duplicate epistasis of additive x dominance interaction was involved for plant height and 1000-grain weight in some crosses. However, plant height and grain weight per ear was governed by additive x additive gene action in one cross, while it was due to dominance x dominance gene interaction in other cross.

Keywords

Epistasis, additive x additive, additive x dominance, duplicate epistasis, wheat