International Journal of Managment, IT and Engineering
  • Year: 2012
  • Volume: 2
  • Issue: 7

Effects of MG Incorporation on X-Ray Diffraction, U-Vand Photoluminescence Properties of ZnO Thin Films Prepared by Sol-gel Method

  • Author:
  • Seema Singh, Maninder Kaur
  • Total Page Count: 10
  • Page Number: 521 to 530

*Dept. of ECE, Doaba Institute of Engineering and Technology, Kharar, Mohali, Punjab, India

Online published on 26 June, 2013.

Abstract

As Well-crystallized MgZnO alloy thin films with hexagonal wurtzite structure were fabricated by sol-gel method. With the band gap increases, the surface roughness and the grain size reduces. It is worth noting that the intensity of the band-edge luminescence of Mg doped films enhances with the increase of the Mg content. The microstructure and photoluminescence mechanism have been discussed based on X-ray diffraction patterns, atomic force microscopy images, ultraviolet-visible absorption spectra, photoluminescence spectra and Fourier transform infrared spectra.

Keywords

MgZnO thin film, Optical properties, Sol-gel method