International Journal of Meterials Sciences
  • Year: 2009
  • Volume: 4
  • Issue: 4

Dielectric properties of Sr1+XBi2-(2/3)X(VXNb1-X)2O9 [X = 0.1 and 0.2] ceramics

  • Author:
  • B.J. Kalaiselvi
  • Total Page Count: 8
  • Page Number: 397 to 404

Department of Physics, Pondicherry Engineering College, Pondicherry 605 014, India.

Abstract

Results of systematic studies on dielectric properties of Sr1+XBi2-(2/3)X(VXNb1-X)2O9[X = 0.1 and 0.2] prepared by solid state route is reported. X-ray diffraction (XRD) studies on Sr1+XBi2-(2/3)X(VXNb1-X)2O9 with X = 0.1 revealed that the single-phase layered perovskites was formed without any detectable secondary phase However, with X=0.2, in addition to the major layered perovskite phase, a minor unknown phase was noticed. An enhancement in the dielectric properties of SrBi2Nb2O9 (SBN) was observed with the increase in partial substitution of pentavalent niobium ions (0.68 Å) by smaller pentavalent vanadium ions (0.59 Å) in the B sites.

Keywords

Aurivillius family, layered oxides, ceramics, rattling space, dielectric property