The structural properties of thin film of Lead Phthalocyanine (PbPc) on a glass substrate is prepared by vacuum deposition method. The thickness of the films were 150nm, 300nm and 450nm. The effect of film thickness, structural and annealing of the Lead Phthalocyanine thin films are investigated by X-ray diffraction and Scanning Electron Microscopy (SEM). The results obtained from X-ray diffraction measurement indicate the monoclinic structure with a (001), (320), (111) and (420) orientation and triclinic structure with (400) orientation. Thickness of 450 nm is annealed at 323 K and 373 K. The film consist of triclinic (200), (300) and (400) phases for 323 K annealed sample and (100) reflection of triclinic phase for 373 K annealed sample. SEM is one of the best tools to investigate the surface smoothness and to find the grain size of the particles. From the image it is evident that the surface of the films is smooth and grain size is less than a micrometer.
Lead Phthalocyanine, diffraction, Scanning electron microscopy, monoclinic and triclinic
