EC531185 (EC531185; INGR18011), aWheat (Triticum aestivum) Germplasm with Low DSI (Drought Susceptibility Index) <0.5 for 5–6 traits including yield/m2. High & Stable Grain/Spike under Irrigated and Non-Irrigated Conditions. Presence of Genes Associated with Various Drought Responsive Traits viz., Thylakoid Membrane Stability (Fv/Fm), Grain Filling Duration (GYD), Grain Yield (GY) and Gene Maintaining Low Leaf Temperature under Drought Stress Condition.

Year: 2019
Volume: 32
Issue: 3

Author:
Sundeep Kumar^1,, Jyoti Kumari¹, Rakesh Singh¹, Ruchi Bansal¹, AK Singh¹, Ashok Kumar¹, RS Sengar², MK Yadav², BR Kuri¹, D Upadhyay¹, A Srivastava¹, B Rana², VK Vikas³, GP Singh⁴
Total Page Count: 2
Page Number: 419 to 420

¹ICAR-National Bureau of Plant Genetic Resources, New Delhi, Delhi, India

²SVP University of Agril. & Tech., Meerut, Uttar Pradesh, India

³ICAR-Indian Agricultural Research Institute, Regional Station, Wellington, Tamil Nadu, India

⁴ICAR-Indian Institute of Wheat and Barley Research, Karnal, Haryana, India

Online published on 31 January, 2020.