Standardization of X-Ray Radiography Methodology for the Detection of Hidden Infestation In Pulses*

Investigation were carried out on standardization of X-ray radiography methodology for the detection of hidden insect infestation in pulses. Studies revealed that the controllable input electrical parameters of the x-ray machine viz., voltage, current and exposure period required for the detection of hidden insect infestation varied widely for different pulse seed materials. High voltage and current were required for dense seed materials to ensure adequate penetration of radiation compared to light seed materials. The best combinations of input value selected for the detection of hidden infestation of pulse beetle, Callosobruchus chinensis were 20 KV, 10 mA, 25 seconds for urdbean and mungbean; 20 KV, 12 mA for 25 seconds for cowpea; 25 KV, 10 mA, 25 seconds for soybean; 15 KV, 12 mA, 25 seconds for lentil; and 25 KV, 8 mA, 25 seconds for Dolichos. Similarly, the germination percentage of pulses that were subjected to investigation varied from 80–100% for urdbean, mungbean, cowpea, soybean, lentil, french bean and 90–100% for Dolichos exhibited that these soft X-rays did not affect the viability of seeds.