A System of Two Identical and Opposite Magnets Focusing Beam Charged Particles Passing Through Them

In this work, we use two magnets placed in front of the path of charged particles to obtain the best focusing of charged particles in both the horizontal and vertical planes. We trace the path of charged particles from the extraction region at the ion source, until reach to the target were traced. The process of tracing the path of charged particles is performed using matrices Transfer Matrix (R-Matrix) and. Beam Matrix)in each region in which passing the charged particles, starting from the extraction region reaching to the target by describing the charged particle beams as phase space ellipse in both the horizontal and vertical planes. The ion beam described as phase space ellipse then study the behavior of beam at the edges of magnet with Identical and Opposite.