Indian Journal of Scientific Research

The synthesis, characterization and dielectric properties of R2Zr2O7, where R = Ho and Er have been studied. All the rare earth zirconate were prepared by solid state reaction technique and characterized by XRD, differential thermal analysis (DTA), thermogravimetric analysis (TGA) and derivative thermogravimetry (DTG). The XRD characterization shows the formation of single phase orthorhombic structure at room temperature. The dielectric constant (ε'), dielectric loss (ε'') and quality factor (Q) of the compounds have been measured at 1kHz in the temperature range 300 to 1125K. The dielectric constant of Ho₂Zr₂O₇ and Er₂Zr₂O₇ show rapid increase above 670K and 710K respectively. The dielectric loss shows similar behaviour as dielectric constant.