An Insight into Particle Size and Strain Analysis of Y_2/3Cu₃Ti₄^O12(YCTO) sample by XRD

Among different techniques, for measuring particle size and its distributions, XRD is a versatile technique to determine the particle size along with phase identification of nanomaterial. But XRD peaks get broadened, a little, due to instrument and the specimen itself. Non-ideal optical effects of the X-Ray Diffractometer along with wavelength distribution of the Cu Kα radiation causes instrumental broadening while lattice distortion causes strain and in addition to these, imperfections in crystal cause peak broadening due to sample itself during XRD characterization. We report the particle size and strain analysis of Y_2/3Cu₃Ti₄^O12(YCTO) ceramic synthesized by semi-wet route by XRD analysis. YCTO is structurally and functionally analogous to nanostructured CaCu₃Ti₄O₁₂ type ceramic materials which may be suitable for technological applications in microelectronics as high dielectric constant materials. Williamson-Hall's plot analysis was applied to investigate the broadening effects in Y_2/3Cu₃Ti₄^O12 ceramic. Crystallite size and micro-strain in lattice were determined to be equal to 6.8 nm and 3.6 × 10⁻³ % respectively, using defect free silicon as a reference material for correction due to instrumental broadening. The calculated crystallite size confirms the nano-particle range