1Krishna Institute of Science and Technology, Krishna Vishwa Vidyapeeth “Deemed to be University”, Karad, Satara - 415 539, Maharashtra, India, E-mail: aishwarya22999@gmail.com
2Department of Pharmacogonsy, Krishna Institute of Pharmacy, Krishna Vishwa Vidyapeeth “Deemed to be University”, Karad, Satara - 415 539, Maharashtra, India, E-mail: pallavi241983@gmail.com
3Department of Agronomy, Institute of Agricultural Sciences, Siksha ‘O’ Anusandhan (Deemed to be University), Bhubaneswar - 751 030, Odisha, India, E-mail: subhapradadash@soa.ac.in
4Department of Bioinformatics, Sathyabama Institute of Science and Technology, Chennai - 600 119, Tamil Nadu, India, E-mail: roselinjenifer.d.bte@sathyabama.ac.in
Department of Biotechnology and Microbiology, Noida International University, Greater Noida, Gautam Buddha Nagar – 201 310, Uttar Pradesh, India
*Corresponding authors’ E-mail: shilpy.singh@niu.edu.in
Online published on 18 February, 2026.
The long-term goal of this study is to look at how pest populations change, how pesticides work against them, and what effects this has on the cost of growing grains. Over the past ten years, climate change, farming practices, and more global trade have all changed the agricultural environment. These changes have led to the appearance of new pests or minor pests becoming major pests. To come up with effective ways to get rid of pests, you need to understand these trends. Our researches show that pest populations have changed a lot, with new pests have come into environment and familiar pesticides are no longer effective against pests. The infestation of fall armyworms in corn increased by 80%, and the number of brown planthoppers that were resistant to pesticides increased from 20 to 65% in rice. Also, yield losses due to pests went up, with rice in Southeast Asia losing 30% of its output. The data make it clear how important it is to have integrated pest management (IPM) methods that can change as pests do.
Agriculture, Climate change, Crops, Food security, Grain, Management, Pest monitoring, Resistance, Yield
