1Department of Electrical and Electronics Engineering, Amrita School of Engineering, Amrita Vishwa Vidyapeetham Coimbatore, India, Email: revanth123451.rk@gmail.com
2Department of Electrical and Electronics Engineering, Amrita School of Engineering, Amrita Vishwa Vidyapeetham, Coimbatore, India, t_ananthan@cb.amrita.edu
Online published on 7 October, 2019.
A label on any product is important for product detail provided by the manufacturer. Therefore, identification of any defects in the label is one of the important processing stages in the industry, in this context, this paper presents LabVIEW based label inspection using Machine Vision algorithm. LabVIEW code is written for the specification of the manufacturer, such as label prints, typo error, angle of pasting the label and automatically rejects the product from the packaging line. A software framework that collects camera images, associates these images to individual objects and executes inspection modules to actually evaluate the images. A label with the different specification is taken and the images are evaluated using Machine Vision algorithm and the results are found satisfactory. The experiment results are presented and discussed.
LabVIEW, Vision Assistant, USB Cameras