Year: 2022
Volume: 65r
Issue: 3

Numerical Relay Testing and Validation in Relay Life Cycle

Author:
Patki Sanjay, Dave Kamin, Kulkarni Suyash
Total Page Count: 1
Page Number: 72 to 72

*Tata Power-Adviser

**Ashida, India

CIGRE Paris Session 2018

Keywords

Relay life cycle tests, Type of tests, Production tests, FAT, SAT, Test Methods, Process bus testing, Digital Substation